Profile: AEP Technology provides optical profilers, interferometers, and contact profilometers. Our contact 3D surface profilometer is a seamless integration of conventional contact profilometer and scanning probe microscope. It generates both detailed 3D and 2D images up to 150 X 150 mm scanning area. Our profilometer utilizes ultra low force that allows it to measure surface topography for any kind of materials. It is used for both research and production environments. Our optical thin film deposition controller employs a broadband visible light source with high sensitivity detectors, to achieve precision measurement of transmission & reflection light intensity simultaneously during transparent film depositions. The sophisticated software package calculates the film growth in real time with the photometric measurement data, and it accurately determines the end points of each deposited layer.