Profile: Accel-RF Corp. provides fully integrated RF accelerated life-test/burn-in test systems for compound semiconductor devices which are used in the implementation of broadband wireless infrastructures and networks. The RF automated accelerated reliability test station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus. It features up to 36 channels in a 3-bay rack, individual control of each DUTs temperature allows software control of channel temperature without requiring constant power dissipation and DC power designs.