Profile: Advanced Microtechnology, Inc. specializes in offering burn-in test systems, burn-in boards, burn-in testers and services. The Optimum™ 200-SEM is one of the most sophisticated burn-in systems developed for both engineering and production test applications. With a high speed timing generator and local processor at each burn-in board location, it represents the state-of-the-art in test during burn-in (TDBI) for semiconductor memory products. The system has been developed for high density memory testing in a burn-in environment. The system provides functional verification of DRAMs, SRAMs and EPROMs. The system has 208 driver interface channels 32 chip selects, 128 Data I/O, 18 clocks (RAS, WE, ) 30 addresses. 16 bit data in word is supplied to the 128 I/O interface. All input signals are looped back to ensure integrity. The signal configuration provides testing of DRAMs to 1G x and SRAMs to 1G x. Address scrambling is provided on row and column boundaries with logical formatting of data on address state. The HPC-512/1028 automated burn-in board test and inventory control system performs test, record keeping, data retrieval, and maintenance scheduling functions on burn-in boards and interconnect cables. Test system hardware will operate in a PC-compatible environment without additional control cables or hardware. Parametric test boards plug directly into backplane slots. The system is driven by ATS release 4.1 tester software which operations within MS-DOS. System software is fully compatible with a Microsoft Windows environment.