Profile: Advantest America, Inc. specializes in designing electronic measuring equipment and semiconductor test systems essential to the development & manufacture of advanced computer & telecommunications products. The 250MDMA digital module is a complete functional/DC test resource for our T2000 systems. This 250Mbps high-density module provides a total of 128 IO channels, each with digital drive, digital compare, load, DC parametric and frequency measurement capabilities. This module offers unique mixed signal features and provides significant digital capture and real time histogram capabilities. This module is also designed to address high parallel test, supporting pin segmentation to eight 16-channel groups. Additional functional capabilities include scan and algorithmic pattern generation, multiple time domains with free running clocks, and high voltage flash VPP pins. With 7.8125ps resolution on period and edge timing, this module allows for high precision digital timing and good frequency matching with analog instruments. Our T2000 LS main frame features configuration based on a small, space-saving mainframe and 52-module slot test head, a multi-controller architecture that supports multi-site test is employed in order to achieve high throughput test and device interface which features a large layout area that symmetrically distributes many high-speed, high-accuracy pins.