Description: Desktop ATE V200 is a combinational - mixed signal test system. This economic system is used to provide the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them offline. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP and FBGA VLSI chip. It provides a card edge functional test for both digital and analogue and in circuit functional test for localized test of individual devices including LSI/VLSI/memory and microprocessors. It is supported with combinational tester with digital/analogue and mixed signal test capabilities through simple clips and probes or through card edge or as a cluster tester with a special test fixture for up to 96 test pins. Its basic timing unit is 100 ns and thus can generate test patterns at 10 MHz data rate. It is provided with 8K x 4 RAM, behind each digital pin electronics and 8K x 24 RAM, behind every analogue channel. Its advanced sequencer allows external event synchronization or handshake, which are very essential in complex microprocessor tests.
