Profile: FRT of America, LLC offers non-contact metrology tools such as profilometer for the investigation of surface topography, profile, film thickness, roughness and abrasion. We provide measuring systems which measures profile, roughness, topography or film thickness and sensors. We design and manufacture highly specialized solutions for applications in demanding production environments. Our MicroProf® TTV quickly measures both sides of a part simultaneously or total thickness variation as well as the roughness, contour and topography on both surfaces. Our sensors include atomic force microscope, confocal, thin film, high resolution infrared light & chromatic white light sensor and infrared film thickness interferometer.