Profile: Imago Scientific Instruments Corp. provides metrology and analysis equipment serving the microelectronic & general research markets. LEAP Si™ metrology system is a atom probe microscope providing 3D, atomic resolution, compositional imaging and analysis to research & industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either an ultra-fast voltage pulse or laser pulse. The system employs patented innovations that unlock the power of the 3D atom probe to address previously unsolved measurement challenges in semiconductors, material science and nanomagnetics. The features includes largest field of view, highest data rate, mass resolution and simplified sample preparation using microtip arrays. Laser pulsing mode expands the universe of applications for LEAP™ to low electrical conductivity materials including semiconductors and ceramics. In this the LEAP™ electrode applies a static field to the specimen while an ultra-fast laser pulse triggers the removal of an atom. The module features a high pulse-repetition rate and proprietary real-time, optical-alignment correction which together enable high mass resolution, a large field of view and fast time to results.