Profile: J. A. Woollam Co., Inc. is a manufacturer of spectroscopic ellipsometers for non-destructive thin film and bulk material characterization. Our spectroscopic ellipsometry has become the standard for measuring thin film thickness and optical constants and is used for characterization of all types of materials such as dielectrics, semiconductors, metals and organics. We offer ellipsometers covering a spectral range to meet any need from the vacuum UV to the far IR.