Profile: Jeol(UK) Ltd. is a supplier of scanning electron microscopes (SEMs), transmission electron microscopes (TEMs), scanning probe microscopes (SPMs), mass spectrometers, NMR spectrometers, and semiconductor tools for scientific and industrial purposes. Our product line includes electron optic, analytical, semiconductor equipment, and industrial equipment. Our electron optic instruments include scanning, transmission electron, and scanning probe microscopes. Our JSM-6510 is a scanning electron microscope which is used for fast characterization and imaging of fine structures. It features a high resolution of 3.0 nm at 30 kV. The JSM-6510's features include amazing clarity of the finest structures, fast unattended data acquisition (with optional stage automation), smart settings for common samples (create/store/recall), streamlined design, compact footprint, and customized toolbars for repetitive functions. Our JBX-3050MV series is an electron beam lithography system used for the mask/reticle fabrication that meets the design rule of 45 to 32 nm. This system features pattern writing with speed, accuracy, and possesses high reliability.