Profile: Jordan Valley Semiconductors UK Ltd. is a provider of metrology solutions for thin films. We concentrate on the semiconductor industry. We specialize in non-contacting and non-destructive X-ray technology. Our JVX7200 X-ray metrology tool combines advanced high-resolution X-ray diffraction and X-ray reflectivity channels to provide composition, thickness, strain, relaxation characterization and metrology for epitaxial layers. It consists of features like low-power, high-brightness X-ray tube, convergent beam, low-noise, high resolution 1D detectors, pattern recognition system, high-precision staging, multi-core computer, advanced data analysis algorithms, software, and various loadport options. Our QC3 is a high resolution XRD system for epilayers or thin films. It is designed for high-throughput and mass production operation. It supports multi-wafer configuration in a single sample-plate. It targets production fabs of LED and epilayer wafers.