Profile: Logos Systems International is a provider of X-ray inspection systems. Our 3D X-ray beam inspection systems combines precision metrology with radiation detection to form a completely electronic alternative to film-based measurement. We specialize in implementing optical character recognition and verification, bar-code reading & metrology systems on embedded PC platforms. Our beam profiles and aperture widths can be obtained with a single mouse click & automation scripts can be used to record changes in the beam shape and intensity. Our brands include LVS™, Octaveo™, DoubleTake™, DocTools™ and DocView™.