Profile: Oxford Instruments provides high technology tools and systems for industrial & research markets, based on our ability to analyze & manipulate matter at the smallest scale. Our tools & systems are used across a wide range of industries for applications that include quality control, elemental analysis, compliance testing, scrap metal recycling, and coating thickness measurement. Our core technologies include X-ray fluorescence (XRF), optical emission spectroscopy (OES), nuclear magnetic resonance (NMR), and energy & wavelength dispersive microanalyses. X-MET5100, our newest hand-held XRF analyzer takes the analytical performance of XRF to a completely new level. The combination of a groundbreaking silicon drift detector (SDD) and powerful 45kV X-ray tube enables the analysis of light elements, such as Mg, Al, and Si without the need for complex vacuum or helium attachments. Alloy analysis as low as 200 ppm of Nb in low alloy steels can be completed in less than 5 seconds. This same instrument will also analyze restricted elements in plastics (Cd, Pb, Hg, Cl, Cr, and Br content in restricted compounds) in less than 10 seconds. X-MET5000 a hand-held XRF analyzer, is an ideal tool for ELV applications, where hazardous or restricted elements are to be detected, or where material verification is to be conducted.