Profile: Solid State Measurements, Inc. is a designer and manufacturer of equipments for semiconductor material characterization & process control. Our products include FastGate™ systems, Hg Probe mapping systems, NanoSRP® automatic spreading resistance systems and NeoMetrik™ microwave systems. Our SSM 5130 fully automatic mapping system provides a variety of electrical characterization measurements for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing. Our SSM 2000 NanoSRP® system provides high-speed carrier density and resistivity depth profiling using spreading resistance profiling technology.