Profile: View Micro-Metrology produces video coordinate measuring systems for process control metrology. We are an ISO 9001 certified company. Our optical metrology system is used for wafer, photo mask, slider, MEMS, semiconductor package, HDD suspension, probe card and micro-component process measurements. We provide pinnacle which features a damped granite base and column, with passive vibration isolation & it is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays & chip scale packages. We offer Microline® critical dimension measurement systems which are designed specifically for semiconductor and MEMs wafer & photomask CD metrology & this systems automatically measure linewidth, overlay registration & other critical features.